A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Dionyz Pogany; Erich Gornik; J. Willemen; Ning Qu; Wolfgang Wilkening; L. Zullino; A. Andreini (Microelectron. Reliab., 2003)

Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. - Sergey Bychikhin; Viktor Dubec; Dionyz Pogany; Erich Gornik; M. Graf; V. Dudek; Winfried Soppa (Microelectron. Reliab., 2004)

Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. - Michael Heer; Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; M. Frank; A. Konrad; J. Schulz (Microelectron. Reliab., 2006)

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. - Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Tilo Brodbeck; Wolfgang Stadler (Microelectron. Reliab., 2007)

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)