Program Disturb Mechanism in Embedded SuperFlash® Technology. - Clyde Dunn; John MacPeak; Sean Bo; Brian Kirkpatrick; Brian Horning; Tad Grider; Corey O'Brien; Steve Heinrich-Barna; Armando Vigil; Jon Nafziger; Lyndon Preiss; Kelly DeShields; et al. (IRPS, 2020)

Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. - Viktor Markov; Gilles Festes; Louisa Schneider; Steven Lemke; Serguei Jourba; Alexander Kotov (IMW, 2023)