Acceleration of the ADC Test With Sine-Wave Fit. - Vilmos Pálfi; István Kollár (IEEE Trans. Instrum. Meas., 2013)

Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms. - Balazs Renczes; István Kollár; Paolo Carbone; Antonio Moschitta; Vilmos Pálfi; Tamas Virosztek (I2MTC, 2015)

An Improved Sine Wave Histogram Test Method for ADC Characterization. - Vilmos Pálfi (IEEE Trans. Instrum. Meas., 2019)

A computationally efficient non-iterative four-parameter sine fitting method. - Balázs Renczes; Vilmos Pálfi (IET Signal Process., 2021)