Improved interferometric method to measure near-carrier AM and PM noise. - Enrico Rubiola; Vincent Giordano; Jacques Groslambert (IEEE Trans. Instrum. Meas., 1999)

The ±45° correlation interferometer as a means to measure phase noise of parametric origin. - Enrico Rubiola; Vincent Giordano; Hermann Stoll (IEEE Trans. Instrum. Meas., 2003)

Reliability and Reproducibility of the Cryogenic Sapphire Oscillator Technology. - Christophe Fluhr; Benoit Dubois; Guillaume Le Tetu; Valérie Soumann; Julien Paris; Enrico Rubiola; Vincent Giordano (IEEE Trans. Instrum. Meas., 2023)