Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. - Magali Bastian; Vincent Gouin; Patrick Girard 001; Christian Landrault; Alexandre Ney; Serge Pravossoudovitch; Arnaud Virazel (ATS, 2007)

A Design-for-Diagnosis Technique for SRAM Write Drivers. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2008)

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. - Alexandre Ney; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (VTS, 2008)

A new design-for-test technique for SRAM core-cell stability faults. - Alexandre Ney; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian; Vincent Gouin (DATE, 2009)