An SOC platform for ADC test and measurement. - Brendan Mullane; Vincent O'Brien; Ciaran MacNamee; Thomas Fleischmann (DDECS, 2009)

An on-chip solution for static ADC test and measurement. - Brendan Mullane; Ciaran MacNamee; Vincent O'Brien; Thomas Fleischmann (ACM Great Lakes Symposium on VLSI, 2009)

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. - Brendan Mullane; Vincent O'Brien; Ciaran MacNamee; Thomas Fleischmann (ITC, 2009)

A prototype platform for system-on-chip ADC test and measurement. - Brendan Mullane; Vincent O'Brien; Ciaran MacNamee; Thomas Fleischmann (SoCC, 2009)

High order mismatch noise shaping for bandpass DACs. - Vincent O'Brien; Brendan Mullane (ICECS, 2011)

A high performance band-pass DAC architecture and design targeting a low voltage silicon process. - Brendan Mullane; Vincent O'Brien (VLSI-SoC, 2011)

A 100dB SFDR 0.5V pk-pk Band-Pass DAC Implemented on a Low Voltage CMOS Process. - Brendan Mullane; Vincent O'Brien (VLSI-SoC (Selected Papers), 2011)

Experimental validation of DAC with nested bus-splitting EFM4 DDSM. - Hongjia Mo; Michael Peter Kennedy; Vincent O'Brien; Brendan Mullane (ECCTD, 2013)

An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test. - Brendan Mullane; Vincent O'Brien (MWSCAS, 2018)

A Reduced Hardware ISI and Mismatch Shaping DEM Decoder. - Vincent O'Brien; Anthony G. Scanlan; Brendan Mullane (Circuits Syst. Signal Process., 2018)

Correction to: A Reduced Hardware ISI and Mismatch Shaping DEM Decoder. - Vincent O'Brien; Anthony G. Scanlan; Brendan Mullane (Circuits Syst. Signal Process., 2018)

A Wideband 6th Order Programmable Bandpass DEM Implementation for a Nyquist DAC. - Shantanu Mehta; Brendan Mullane; Vincent O'Brien; Roberto Pelliconi; Christophe Erdmann (ICECS, 2020)

Analysis and Design of a Tri-Level Current-Steering DAC With 12-Bit Linearity and Improved Impedance Matching Suitable for CT-ADCs. - Shantanu Mehta; Daniel O'Hare; Vincent O'Brien; Eric Thompson; Brendan Mullane (IEEE Open J. Circuits Syst., 2020)

High Order Mismatch Shaping for Low Oversampling Rates. - Vincent O'Brien; Brendan Mullane (IEEE Trans. Circuits Syst. II Express Briefs, 2020)

A Higher-Order Programmable Amplitude and Timing Error Shaping Bandpass DEM for Nyquist-Rate D/A Converters. - Shantanu Mehta; Brendan Mullane; Vincent O'Brien; Roberto Pelliconi; Christophe Erdmann (ISCAS, 2021)

Metric Embedding Sub-discrimination Study. - Ryan Furlong; Vincent O'Brien; James Garland; Francisco Domínguez-Mateos (CoRR, 2021)

Parameter Analysis of Multiscale Two-Dimensional Fuzzy and Dispersion Entropy Measures Using Machine Learning Classification. - Ryan Furlong; Mirvana Hilal; Vincent O'Brien; Anne Humeau-Heurtier (Entropy, 2021)

Comparison of High-Order Programmable Mismatch Shaping Bandpass DEM Implementations Applicable to Nyquist-Rate D/A Converters. - Shantanu Mehta; Roberto Pelliconi; Christophe Erdmann; Vincent O'Brien; Brendan Mullane (IEEE Open J. Circuits Syst., 2021)

Deep Learning and Entropy-Based Texture Features for Color Image Classification. - Emma Lhermitte; Mirvana Hilal; Ryan Furlong; Vincent O'Brien; Anne Humeau-Heurtier (Entropy, 2022)

Zero-shot Learning for Subdiscrimination in Pre-trained Models. - Francisco Domínguez-Mateos; Vincent O'Brien; James Garland; Ryan Furlong; Daniel Palacios-Alonso (J. Univers. Comput. Sci., 2025)