An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Vincent Pouget; Pascal Fouillat; Dean Lewis; Hervé Lapuyade; L. Sarger; F. M. Roche; S. Duzellier; R. Ecoffet (IOLTW, 2000)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)

Theoretical Investigation of an Equivalent Laser LET. - Vincent Pouget; Hervé Lapuyade; Pascal Fouillat; Dean Lewis; S. Buchner (Microelectron. Reliab., 2001)

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. - Dean Lewis; Pascal Fouillat; Vincent Pouget (LATW, 2002)

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. - G. Andriamonje; Vincent Pouget; Yves Ousten; Dean Lewis; Yves Danto; Jean-Michel Rampnoux; Younès Ezzahri; Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. - Vincent Pouget; Dean Lewis; Pascal Fouillat (IEEE Trans. Instrum. Meas., 2004)

Dynamic behavior of a chemical sensor for humidity level measurement in human breath. - Angie Tetelin; Vincent Pouget; Jean-Luc Lachaud; Claude Pellet (IEEE Trans. Instrum. Meas., 2004)

Electrical Modeling for Laser Testing with Different Pulse Durations. - Alexandre Douin; Vincent Pouget; Dean Lewis; Pascal Fouillat; Philippe Perdu (IOLTS, 2005)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. - Alexandre Douin; Vincent Pouget; M. De Matos; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2006)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results. - V. Maingot; Jean Baptiste Ferron; Régis Leveugle; Vincent Pouget; Alexandre Douin (Microelectron. Reliab., 2007)

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. - Vincent Pouget; Alexandre Douin; Gilles Foucard; Paul Peronnard; Dean Lewis; Pascal Fouillat; Raoul Velazco (IOLTS, 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

Electrical modeling of the effect of beam profile for pulsed laser fault injection. - C. Godlewski; Vincent Pouget; Dean Lewis; Mathieu Lisart (Microelectron. Reliab., 2009)

Net integrity checking by optical localization techniques. - Gérald Haller; Aziz Machouat; Dean Lewis; Vincent Pouget (Microelectron. Reliab., 2009)

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. - Roxane Llido; J. Gomez; Vincent Goubier; N. Froidevaux; L. Dufayard; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2011)

Effects of 1064 nm laser on MOS capacitor. - R. Llido; Pascal Masson; Arnaud Régnier; Vincent Goubier; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. - Alexandre Sarafianos; Roxane Llido; Jean-Max Dutertre; Olivier Gagliano; Valerie Serradeil; Mathieu Lisart; Vincent Goubier; Assia Tria; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. - Nogaye Mbaye; Vincent Pouget; Frédéric Darracq; Dean Lewis (Microelectron. Reliab., 2013)

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. - I. El Moukhtari; Vincent Pouget; C. Larue; Frédéric Darracq; Dean Lewis; Philippe Perdu (Microelectron. Reliab., 2013)

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. - Vincent Pouget; S. Jonathas; R. Job; J.-R. Vaillé; Frederic Wrobel; Frédéric Saigné (Microelectron. Reliab., 2017)

A calculation method to estimate single event upset cross section. - Frederic Wrobel; Antoine D. Touboul; Vincent Pouget; Luigi Dilillo; Jerome Boch; Frédéric Saigné (Microelectron. Reliab., 2017)

Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications. - Gennaro Severino Rodrigues; Fernanda Lima Kastensmidt; Vincent Pouget; Alberto Bosio (IOLTS, 2018)

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection. - Gennaro Severino Rodrigues; Fernanda Lima Kastensmidt; Vincent Pouget; Alberto Bosio (LATS, 2018)

Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods. - Fabio Benevenuti; Fabiano Libano; Vincent Pouget; Fernanda Lima Kastensmidt; Paolo Rech (SBCCI, 2018)

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. - Ygor Q. Aguiar; Frederic Wrobel; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Antoine D. Touboul; Vincent Pouget (Microelectron. Reliab., 2018)

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection. - Gennaro Severino Rodrigues; Ádria Barros de Oliveira; Fernanda Lima Kastensmidt; Vincent Pouget; Alberto Bosio (J. Electron. Test., 2019)

Effect of Temperature on Single Event Latchup Sensitivity. - S. Guagliardo; Frederic Wrobel; Ygor Q. Aguiar; Jean-Luc Autran; Paul Leroux; Frédéric Saigné; Vincent Pouget; Antoine D. Touboul (DTIS, 2020)

Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. - Israel C. Lopes; Vincent Pouget; Frederic Wrobel; Frédéric Saigné; Antoine D. Touboul; Ketil Røed (LATS, 2020)