Analysis of electro-thermal effects in semiconductor devices. - Vincenzo d'Alessandro (2002)

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors. - Nebojsa Nenadovic; Slobodan Mijalkovic; Lis K. Nanver; Lode K. J. Vandamme; Vincenzo d'Alessandro; Hugo Schellevis; Jan W. Slotboom (IEEE J. Solid State Circuits, 2004)

Influence of charge balance on the robustness of trench-based super junction diodes. - Ana Villamor-Baliarda; Piet Vanmeerbeek; Michele Riccio; Vincenzo d'Alessandro; Andrea Irace; Jaume Roig; David Flores; Peter Moens (Microelectron. Reliab., 2012)

Dynamic electrothermal macromodeling techniques for thermal-aware design of circuits and systems. - Alessandro Magnani; Vincenzo d'Alessandro; Niccolò Rinaldi; Massimiliano de Magistris; Klaus Aufinger (PATMOS, 2013)

Evaluation of thermal balancing techniques in InGaP/GaAs HBT power arrays for wireless handset power amplifiers. - Andre G. Metzger; Vincenzo d'Alessandro; Niccolò Rinaldi; Peter J. Zampardi (Microelectron. Reliab., 2013)

Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. - Vincenzo d'Alessandro; Alessandro Magnani; Michele Riccio; Yohei Iwahashi; Giovanni Breglio; Niccolò Rinaldi; Andrea Irace (Microelectron. Reliab., 2013)

3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. - Michele Riccio; Vincenzo d'Alessandro; Andrea Irace; Gilles Rostaing; Mounira Berkani; Stéphane Lefebvre; Philippe Dupuy (Microelectron. Reliab., 2014)

Structure-preserving approach to multi-port dynamic compact models of nonlinear heat conduction. - Lorenzo Codecasa; Vincenzo d'Alessandro; Alessandro Magnani; Niccolò Rinaldi (Microelectron. J., 2015)

Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. - Thomas Jacquet; Grazia Sasso; Anjan Chakravorty; Niccolò Rinaldi; Klaus Aufinger; Thomas Zimmer; Vincenzo d'Alessandro; Cristell Maneux (Microelectron. Reliab., 2015)

Advanced thermal simulation of SiGe: C HBTs including back-end-of-line. - Vincenzo d'Alessandro; Alessandro Magnani; Lorenzo Codecasa; Niccolò Rinaldi; Klaus Aufinger (Microelectron. Reliab., 2016)

Model-Order Reduction Procedure for Fast Dynamic Electrothermal Simulation of Power Converters. - Antonio Pio Catalano; Michele Riccio; Lorenzo Codecasa; Alessandro Magnani; Gianpaolo Romano; Vincenzo d'Alessandro; Luca Maresca; Nils Rinaldi; Giovanni Breglio; Andrea Irace (ApplePies, 2017)

3-D thermal models calibration by parametric dynamic compact thermal models. - Lorenzo Codecasa; Vincenzo d'Alessandro; Alessandro Magnani; Niccolò Rinaldi (Microelectron. Reliab., 2017)

Partition-based approach to parametric dynamic compact thermal modeling. - Lorenzo Codecasa; Vincenzo d'Alessandro; Alessandro Magnani; Niccolò Rinaldi; Andre G. Metzger; Robin Bornoff; John Parry (Microelectron. Reliab., 2017)

Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies. - Vincenzo d'Alessandro; Antonio Pio Catalano; Alessandro Magnani; Lorenzo Codecasa; Niccolò Rinaldi; Brian Moser; Peter J. Zampardi (Microelectron. Reliab., 2017)

Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. - Pascal Chevalier 002; Michael Schröter; Colombo R. Bolognesi; Vincenzo d'Alessandro; Maria Alexandrova; Josef Böck; Ralf Flickiger; Sébastien Fregonese; Bernd Heinemann; Christoph Jungemann; Rickard Lovblom; Cristell Maneux; et al. (Proc. IEEE, 2017)

Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources. - Lorenzo Codecasa; Robin Bornoff; James Dyson; Vincenzo d'Alessandro; Alessandro Magnani; Niccolò Rinaldi (Microelectron. Reliab., 2018)

Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization. - Brice Rogié; Lorenzo Codecasa; Eric Monier-Vinard; Valentin Bissuel; Najib Laraqi; Olivier Daniel; Dario D'Amore; Alessandro Magnani; Vincenzo d'Alessandro; Niccolò Rinaldi (Microelectron. Reliab., 2018)

Defect Detection in Double-Sided Cooled Power Modules by Structure Functions. - Ciro Scognamillo; Antonio Pio Catalano; Vincenzo d'Alessandro; Lorenzo Codecasa; Alberto Castellazzi (PRIME, 2022)

Investigating the Impact of Cracks on Solar Cells Performance: Analysis Based on Nonuniform and Uniform Crack Distributions. - Mahmoud Dhimish; Vincenzo d'Alessandro; Santolo Daliento (IEEE Trans. Ind. Informatics, 2022)

Improving Performance of InGaP/GaAs HBT Arrays by means of Temperature-Dependent Base Ballasting Resistors. - Ciro Scognamillo; Antonio Pio Catalano; Vincenzo d'Alessandro; Peter J. Zampardi; Kerry Burger (PRIME, 2023)

Enhancing Electrical Ruggedness in Double-Sided Cooled Power Modules. - Ciro Scognamillo; Antonio Pio Catalano; Lorenzo Codecasa; Alberto Castellazzi; Vincenzo d'Alessandro (PRIME, 2024)