Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability. - Guillaume Just; Vincenzo Della Marca; Arnaud Régnier; Jean-Luc Ogier; Jérémy Postel-Pellerin; Jean-Michel Portal; Pascal Masson (J. Low Power Electron., 2012)

Effect of ions presence in the SiOCH inter metal dielectric structure. - Benjamin Rebuffat; Vincenzo Della Marca; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Olivier Paulet; Laurent Lopez; Romain Laffont (ESSDERC, 2013)

Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories. - Vincenzo Della Marca; Jérémy Postel-Pellerin; Guillaume Just; Pierre Canet; Jean-Luc Ogier (Microelectron. Reliab., 2014)

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. - Thibault Kempf; Vincenzo Della Marca; L. Baron; F. Maugain; Francesco La Rosa; Stephan Niel; Arnaud Régnier; Jean-Michel Portal; Pascal Masson (IRPS, 2018)

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. - Vincenzo Della Marca; Jérémy Postel-Pellerin; Thibault Kempf; Arnaud Régnier; Philippe Chiquet; Marc Bocquet (Microelectron. Reliab., 2018)

True random number generation exploiting SET voltage variability in resistive RAM memory arrays. - Jérémy Postel-Pellerin; Hussein Bazzi; Hassen Aziza; Pierre Canet; Mathieu Moreau; Vincenzo Della Marca; Adnan Harb (NVMTS, 2019)

AC stress reliability study of a new high voltage transistor for logic memory circuits. - Jordan Locati; Vincenzo Della Marca; Christian Rivero; Arnaud Régnier; Stephan Niel; Karine Coulié (IRPS, 2020)

Benchmarking and optimization of trench-based multi-gate transistors in a 40 nm non-volatile memory technology. - Romeric Gay; Vincenzo Della Marca; Hassen Aziza; Arnaud Régnier; Stephan Niel; Abderrezak Marzaki (DTIS, 2021)

Hot Electron Source Side Injection Comprehension in 40nm eSTM™. - Franck Melul; Thibault Kempf; Vincenzo Della Marca; Marc Bocquet; Madjid Akbal; Frederique Trenteseaux; Marc Mantelli; Arnaud Régnier; Stephan Niel; Francesco La Rosa (IMW, 2021)

A Self-referenced and regulated sensing solution for PCM with OTS selector. - J. Gasquez; Bastien Giraud; P. Boivin; Y. Moustapha-Rabault; Vincenzo Della Marca; Jean-Pierre Walder; Jean-Michel Portal (VLSI-SoC, 2021)

A Regulated Sensing Solution Based on a Self-reference Principle for PCM + OTS Memory Array. - J. Gasquez; Bastien Giraud; P. Boivin; Y. Moustapha-Rabault; Vincenzo Della Marca; Jean-Michel Walder; Jean-Michel Portal (VLSI-SoC (Selected Papers), 2021)

40nm SONOS Embedded Select in Trench Memory. - Radouane Habhab; Vincenzo Della Marca; Pascal Masson; Nadia Miridi; Clement Pribat; Simon Jeannot; Thibault Kempf; Marc Mantelli; Philippe Lorenzini; Jean-Marc Voisin; Arnaud Régnier; Stephan Niel; et al. (ESSDERC, 2023)