A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (MTDT, 2002)

Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. - Davide Appello; Paolo Bernardi; Alessandra Fudoli; Maurizio Rebaudengo; Matteo Sonza Reorda; Vincenzo Tancorre; Massimo Violante (ITC, 2003)

Yield Analysis of Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Emil Gizdarski; Ben Mathew; Vincenzo Tancorre (VTS, 2004)

Understanding Yield Losses in Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Vincenzo Tancorre; Emil Gizdarski; Ben Mathew (IEEE Des. Test Comput., 2004)

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Paolo Bernardi; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (J. Electron. Test., 2004)

Embedded Memory Diagnosis: An Industrial Workflow. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (ITC, 2006)

On the Automation of the Test Flow of Complex SoCs. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (VTS, 2006)

Optimized embedded memory diagnosis. - Mauricio de Carvalho; Paolo Bernardi; Matteo Sonza Reorda; Nicola Campanelli; Tamas Kerekes; Davide Appello; Mario Barone; Vincenzo Tancorre; Marco Terzi (DDECS, 2011)

Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. - F. Almeida; Paolo Bernardi; D. Calabrese; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli; Gulio Zoppi (DDECS, 2019)

Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Littardi; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (DDECS, 2021)

Innovative methods for Burn-In related Stress Metrics Computation. - Walter Ruggeri; Paolo Bernardi; Stefano Littardi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli (DTIS, 2021)

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Claudia Tempesta; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (DFT, 2022)

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. - Francesco Angione; Davide Appello; J. Aribido; Jyotika Athavale; Nicolò Bellarmino; Paolo Bernardi; Riccardo Cantoro; Corrado De Sio; Tommaso Foscale; Gabriele Gavarini; J. Guerrero; Martin Huch; et al. (ETS, 2022)

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ETS, 2022)

A novel SEU injection setup for Automotive SoC. - Giusy Iaria; Tommaso Foscale; Paolo Bernardi; Luca Presicce; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ISIE, 2022)

An innovative Strategy to Quickly Grade Functional Test Programs. - Francesco Angione; Paolo Bernardi; Andrea Calabrese; Lorenzo Cardone; A. Niccoletti; Davide Piumatti; Stefano Quer; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ITC, 2022)

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. - Gabriele Filipponi; Giusy Iaria; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (ITC, 2022)

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. - Giusy Iaria; Francesco Angione; Paolo Bernardi; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (LATS, 2022)

Parallel Multithread Analysis of Extremely Large Simulation Traces. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2022)

Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. - Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Vincenzo Tancorre (DDECS, 2023)

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. - Paolo Bernardi; Lorenzo Cardone; Giusy Iaria; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (IOLTS, 2023)

On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. - Francesco Angione; Paolo Bernardi; Riccardo Cantoro; Nicola Di Gruttola Giardino; Davide Piumatti; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre (LATS, 2023)

A guided debugger-based fault injection methodology for assessing functional test programs. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Davide Appello; Claudia Bertani; Vincenzo Tancorre (VTS, 2023)

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. - Francesco Angione; Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Quer; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2023)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)

A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. - Nicola Di Gruttola Giardino; Francesco Angione; Paolo Bernardi; Tommaso Foscale; Claudia Bertani; Vincenzo Tancorre (DFT, 2024)

Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. - Francesco Angione; Paolo Bernardi; Claudia Bertani; Lorenzo Bertetto; Lorenzo Cardone; Nicola Di Gruttola Giardino; Stefano Quer; Vincenzo Tancorre (LATS, 2025)

Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. - Paolo Bernardi; Gabriele Filipponi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (LATS, 2025)

A System-Level Test Methodology for Communication Peripherals in System-on-Chips. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Gabriele Filipponi; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. - Giusy Iaria; Paolo Bernardi; Claudia Bertani; Lorenzo Cardone; Giuseppe Garozzo; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. - Francesco Angione; Paolo Bernardi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)