Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory. - Meindert Lunenborg; Tomasz Brozek; Laura Lorenzi; Christoph Dolainsky; Violet Liu; Xiaoyi Feng (IRPS, 2023)

Detection of Spider Mites on Labrador Beans through Machine Learning Approaches Using Custom Datasets. - Violet Liu; Jason Chen; Ans Qureshi; Mahla Nejati (CoRR, 2024)