Optimal linear feature selection for a general class of statistical pattern recognition models. - Dean M. Young; Patrick L. Odell; Virgil R. Marco (Pattern Recognit. Lett., 1985)

On the robustness of the equal-mean discrimination rule with uniform covariance structure against serially correlated training data. - Dean M. Young; Danny W. Turner; Virgil R. Marco (Pattern Recognit., 1988)

Predictive discrimination for autoregressive processes. - Virgil R. Marco; Dean M. Young; Danny W. Turner (Pattern Recognit. Lett., 1988)