Errata. - Byron Dom; Virginia H. Brecher; Raymond Bonner; John S. Batchelder; Robert S. Jaffe (Mach. Vis. Appl., 1988)

The P300: A system for automatic patterned wafer inspection. - Byron Dom; Virginia H. Brecher; Raymond Bonner; John S. Batchelder; Robert S. Jaffe (Mach. Vis. Appl., 1988)

Recent advances in the automatic inspection of integrated circuits for pattern defects. - Byron Dom; Virginia H. Brecher (Mach. Vis. Appl., 1995)

Automatic defect classification for semiconductor manufacturing. - Paul B. Chou; A. Ravishankar Rao; Martin C. Sturzenbecker; Frederick Y. Wu; Virginia H. Brecher (Mach. Vis. Appl., 1997)