A Fault-Independent Transitive Closure Algorithm for Redundancy Identification. - Vishal J. Mehta; Kunal K. Dave; Vishwani D. Agrawal; Michael L. Bushnell (VLSI Design, 2003)

Delay Fault Diagnosis for Non-Robust Test. - Vishal J. Mehta; Malgorzata Marek-Sadowska; Zhiyuan Wang; Kun-Han Tsai; Janusz Rajski (ISQED, 2006)

Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. - Vishal J. Mehta; Malgorzata Marek-Sadowska; Kun-Han Tsai; Janusz Rajski (ITC, 2006)

Improving the Resolution of Single-Delay-Fault Diagnosis. - Vishal J. Mehta; Malgorzata Marek-Sadowska; Kun-Han Tsai; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Timing-Aware Multiple-Delay-Fault Diagnosis. - Vishal J. Mehta; Malgorzata Marek-Sadowska; Kun-Han Tsai; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)