Breakdown Voltage Enhancement of GaN diodes with High-k Dielectric. - Vishank Talesara; Yuxuan Zhang; Junao Cheng; Hongping Zhao; Wu Lu (DRC, 2022)

Dynamic Reverse Bias Reliability Testing of SiC MOSFETs. - Vamsi Mulpuri; Vishank Talesara; Kailun Zhong; Siddarth Sundaresan; Navitas Semiconductor (IRPS, 2025)