Mathematical approaches to electron device modelling for non-linear microwave circuit design: State of the art and present trends. - Fabio Filicori; Vito A. Monaco; Giorgio Vannini (Eur. Trans. Telecommun., 1990)

VLSI reliability: Contributions from a three year national research program. - Giovanni Soncini; Claudio Canali; Enrico Zanoni; Francrsco Cors; Alessandro Diligenti; Fausto Fantini; Vito A. Monaco; Guido Masetti; Carlo Morandi (Eur. Trans. Telecommun., 1990)