Review of technology for 157-nm lithography. - A. Keith Bates; Mordechai Rothschild; Theodore M. Bloomstein; Theodore H. Fedynyshyn; Roderick R. Kunz; Vladimir Liberman; Michael Switkes (IBM J. Res. Dev., 2001)

Super-resolution by microspheres and fibers - Myth or reality? - Kenneth W. Allen; Navid Farahi; Yangcheng Li; Nicholaos I. Limberopoulos; Dennis E. Walker; Augustine M. Urbas; Vladimir Liberman; Vasily N. Astratov (ICTON, 2015)

Deep-UV microsphere-assisted ultramicroscopy. - Kenneth W. Allen; Vladimir Liberman; Mordechai Rothschild; Nicholaos I. Limberopoulos; Dennis E. Walker; Augustine M. Urbas; Vasily N. Astratov (ICTON, 2015)