Image recognition problems of fingerprint identification. - Éva Nikodémusz-Székely; Vladimír Székely (Microprocess. Microsystems, 1993)

Thermal test and monitoring [microelectronic structures]. - Vladimír Székely; Márta Rencz (ED&TC, 1995)

Thermal Monitoring Of Safety-Critical Integrated Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (Asian Test Symposium, 1996)

Applied design and analysis of microsystems. - Jean-Michel Karam; Bernard Courtois; András Poppe; Klaus Hofmann; Márta Rencz; Manfred Glesner; Vladimír Székely (ED&TC, 1996)

An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework. - Vladimír Székely; András Poppe; Márta Rencz; Gabor Farkas; Alpar Csendes; Andras Pahi (ED&TC, 1996)

CAD and Foundries for Microsystems. - Jean-Michel Karam; Bernard Courtois; Hicham Boutamine; P. Drake; András Poppe; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (DAC, 1997)

SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. - Vladimír Székely; Andras Pahi; András Poppe; Márta Rencz; Alpar Csendes (ED&TC, 1997)

Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. - Vladimír Székely; Márta Rencz (ICCAD, 1997)

Integrating on-chip temperature sensors into DfT schemes and BIST architectures. - Vladimír Székely; Márta Rencz; Bernard Courtois (VTS, 1997)

CMOS sensors for on-line thermal monitoring of VLSI circuits. - Vladimír Székely; Cs. Márta; Zsolt Kohári; Márta Rencz (IEEE Trans. Very Large Scale Integr. Syst., 1997)

Electro-thermal and logi-thermal simulation of VLSI designs. - Vladimír Székely; András Poppe; Andras Pahi; Alpar Csendes; G. Hajas; Márta Rencz (IEEE Trans. Very Large Scale Integr. Syst., 1997)

Fast Field Solvers for Thermal and Electrostatic Analysis. - Vladimír Székely; Márta Rencz (DATE, 1998)

Tracing the Thermal Behavior of ICs. - Vladimír Székely; Márta Rencz; Bernard Courtois (IEEE Des. Test Comput., 1998)

Thermal Monitoring of Self-Checking Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1998)

Design and Test of MEMs. - Bernard Courtois; Jean-Michel Karam; Salvador Mir; Marcelo Lubaszewski; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (VLSI Design, 1999)

IDDQ Testing of Submicron CMOS - by Cooling? - Márta Rencz; Vladimír Székely; S. Török; Kholdoun Torki; Bernard Courtois (J. Electron. Test., 2000)

Enhancing reliability with thermal transient testing. - Vladimír Székely (Microelectron. Reliab., 2002)

A Fast Algorithm for the Layout Based Electro-Thermal Simulation. - Márta Rencz; Vladimír Székely; András Poppe (DATE, 2003)

Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). - Vladimír Székely (Microelectron. J., 2004)

Die Attach Quality Testing by Fully Contact-less Measurement Method. - György Bognár; Gyula Horváth; Zoltán Szucs; Vladimír Székely (DDECS, 2006)

Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array - György Bognár; Vladimír Székely; Márta Rencz (CoRR, 2007)

Characterization and Modeling of an Electro-thermal MEMS Structure - Péter G. Szabó; Vladimír Székely (CoRR, 2008)

Contactless Thermal Characterization of High Temperature Test Chamber - Zoltán Szucs; György Bognár; Vladimír Székely; Márta Rencz (CoRR, 2008)

Fast field solver for the simulation of large-area OLEDs. - László Pohl; Zsolt Kohári; Vladimír Székely (Microelectron. J., 2010)

Evaluation of short pulse and short time thermal transient measurements. - Vladimír Székely (Microelectron. J., 2010)

Editorial. - Vladimír Székely; Clemens J. M. Lasance (Microelectron. J., 2010)

Possible acception criteria for structure functions. - Albin Szalai; Vladimír Székely (Microelectron. J., 2012)

Measurement of the time-constant spectrum: Systematic errors, correction. - Vladimír Székely; Albin Szalai (Microelectron. J., 2012)

Transformation between linear network features in convolution approach. - Vladimír Székely; Albin Szalai (Int. J. Circuit Theory Appl., 2015)