Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning. - Sophia Bethany Coban; Vladyslav Andriiashen; Poulami Somanya Ganguly; Maureen van Eijnatten; Kees Joost Batenburg (CoRR, 2020)

Unsupervised Foreign Object Detection Based on Dual-Energy Absorptiometry in the Food Industry. - Vladyslav Andriiashen; Robert van Liere; Tristan van Leeuwen; Kees Joost Batenburg (J. Imaging, 2021)

Quantitative Comparison of Deep Learning-Based Image Reconstruction Methods for Low-Dose and Sparse-Angle CT Applications. - Johannes Leuschner; Maximilian Schmidt; Poulami Somanya Ganguly; Vladyslav Andriiashen; Sophia Bethany Coban; Alexander Denker; Dominik F. Bauer; Amir Hadjifaradji; Kees Joost Batenburg; Peter Maass; Maureen van Eijnatten (J. Imaging, 2021)

Quantifying the effect of X-ray scattering for data generation in real-time defect detection. - Vladyslav Andriiashen; Robert van Liere; Tristan van Leeuwen; Kees Joost Batenburg (CoRR, 2023)