ASIC Yield Estimation at Early Design Cycle. - Von-Kyoung Kim; Mick Tegethoff; Tom Chen 001 (ITC, 1996)

ASIC Manufacturing Test Cost Prediction at Early Design Stage. - Von-Kyoung Kim; Tom Chen 001; Mick Tegethoff (ITC, 1997)

Assessing Defect Coverage of Memory Testing Algorithms. - Von-Kyoung Kim; Tom Chen 001 (Great Lakes Symposium on VLSI, 1999)

Fault Coverage Estimation for Early Stage of VLSI Design. - Von-Kyoung Kim; Tom Chen 001; Mick Tegethoff (Great Lakes Symposium on VLSI, 1999)

On comparing functional fault coverage and defect coverage for memory testing. - Von-Kyoung Kim; Tom Chen 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)