Physical analysis of hard and soft breakdown failures in ultrathin gate oxides. - M. K. Radhakrishnan; Kin Leong Pey; C. H. Tung; W. H. Lin (Microelectron. Reliab., 2002)

Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM. - Kin Leong Pey; C. H. Tung; M. K. Radhakrishnan; L. J. Tang; Y. Sun; X. D. Wang; W. H. Lin (Microelectron. Reliab., 2003)

Acquisition of GPS Software Receiver Using Split-Radix FFT. - W. H. Lin; Wei-Lung Mao; Hen-Wai Tsao; Fan-Ren Chang; W. H. Huang (SMC, 2006)

Real-Time Vision-Based Driver Drowsiness/Fatigue Detection System. - K. P. Yao; W. H. Lin; Chiung-Yao Fang; Jung Ming Wang; Shyang-Lih Chang; Sei-Wang Chen (VTC Spring, 2010)

Hardware-in-the-loop simulation of FPGA-based state estimators for electric vehicle batteries. - Rocco Morello; Federico Baronti; X. Tian; Thomas Chau 001; Roberto Di Rienzo; Roberto Roncella; B. P. Jeppesen; W. H. Lin; T. Ikushima; Roberto Saletti (ISIE, 2016)

Ultra High Power Cooling Solution for 3D-ICs. - C. J. Wu; S. T. Hsiao; J. Y. Wang; W. H. Lin; C. W. Chang; T. L. Shao; C. H. Tung; Doug C. H. Yu (VLSI Circuits, 2021)