Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method. - Y. H. Liu; H. Y. Lin; C. M. Jiang; Tahui Wang; W. J. Tsai; T. C. Lu; K. C. Chen; Chih-Yuan Lu (IRPS, 2018)

A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program. - Y. L. Chou; W. J. Tsai; G. W. Wu; W. Chang; T. C. Lu; K. C. Chen; C. Y. Lu (IRPS, 2023)