High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. - Paolo Cova; Roberto Menozzi; Maximilian Dammann; T. Feltgen; W. Jantz (Microelectron. Reliab., 2002)

Reliability of Metamorphic HEMTs for Power Applications. - Maximilian Dammann; F. Benkhelifa; M. Meng; W. Jantz (Microelectron. Reliab., 2002)

Reliability of 70 nm metamorphic HEMTs. - Maximilian Dammann; Arnulf Leuther; Rüdiger Quay; M. Meng; Helmer Konstanzer; W. Jantz; Michael Mikulla (Microelectron. Reliab., 2004)