Multiscale Modeling and Calibration of Hot-Carrier Stress Degradation in SiGe DRAM Peripheral MOSFETs. - L. Silvestri; S. Jin; W. Jeong; H. Shim; W. Yim; H. Kwon; D. Oh; S. Son; N. Zographos; N. Kim; X.-W. Lin; L. Sponton; et al. (IRPS, 2025)