Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. - Michael Heer; Sergey Bychikhin; W. Mamanee; Dionyz Pogany; A. Heid; P. Grombach; M. Klaussner; Winfried Soppa; Bernd Ramler (Microelectron. Reliab., 2007)

Application of transient interferometric mapping method for ESD and latch-up analysis. - Dionyz Pogany; Sergey Bychikhin; Michael Heer; W. Mamanee; Erich Gornik (Microelectron. Reliab., 2011)