Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors. - Tadeu Mota Frutuoso; Xavier Garros; Jose Lugo-Alvarez; Roméo Kom Kammeugne; L. D. M. Zouknak; Abygaël Viey; W. van den Daele; Philippe Ferrari; Fred Gaillard (IRPS, 2022)