Layout options for stability tuning of SRAM cells in multi-gate-FET technologies. - Florian Bauer; Klaus von Arnim; Christian Pacha; Thomas Schulz; Michael Fulde; Axel Nackaerts; M. Jurczak; Wade Xiong; K. T. San; C. Rinn Cleavelin; Klaus Schruefer; Georg Georgakos; et al. (ESSCIRC, 2007)

Efficiency of low-power design techniques in Multi-Gate FET CMOS Circuits. - Christian Pacha; Klaus von Arnim; Florian Bauer; Thomas Schulz; Wade Xiong; K. T. San; Andrew Marshall; Thomas Baumann; C. Rinn Cleavelin; Klaus Schruefer; Jörg Berthold (ESSCIRC, 2007)

Advances in Multi-Gate MOSFET Circuit Design. - Michael Fulde; Klaus von Arnim; Christian Pacha; Florian Bauer; Christian Russ; Domagoj Siprak; Wade Xiong; Andrew Marshall; C. Rinn Cleavelin; Klaus Schruefer; Doris Schmitt-Landsiedel; Gerhard Knoblinger (ICECS, 2007)

Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects. - Sung-Jae Chang; Maryline Bawedin; Wade Xiong; Jong-Hyun Lee; Jung-Hee Lee; Sorin Cristoloveanu (Microelectron. Reliab., 2013)