Implementation of hot-carrier reliability simulation in Eldo. - Medhat Karam; Wael Fikry; Hisham Haddara; Hani F. Ragai (ISCAS (5), 2001)

Series resistance and carrier tunneling of compact model for double gate nanoscale transistors. - Islam Shaboon; Wael Fikry; S. E.-D. Habib (MWSCAS, 2016)