A novel technique for measuring the pulsewidth of nanosecond laser pulses. - Siu-Chung Tam; Wah-Peng Neo; Hock-Chuan Chua; Anthony T. S. Ho; Sing Lee (IEEE Trans. Instrum. Meas., 1998)

Enhanced Fail Rate Projections Using Negative Design Assist in Automotive Grade SRAMs. - Sriram Balasubramanian; Hari Balan; Lei Liu; Kevin Khua; Wah-Peng Neo; Dianji Sui; Tze Ho Simon Chan (IRPS, 2019)

Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. - Tae Young Lee; Kazutaka Yamane; Lee Yong Hau; Robin Chao; Nyuk Leong Chung; Vinayak Bharat Naik; K. Sivabalan; Jae Hyun Kwon; Jia Hao Lim; Wah-Peng Neo; Kevin Khua; Naganivetha Thiyagarajah; et al. (IRPS, 2020)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)