Testability considerations in the design of the MC68340 Integrated Processor Unit. - Philip E. Bishop; Grady Giles; Sudarshan Iyengar; C. Thomas Glover; Wai-On Law (ITC, 1990)

Testing a DSP-Based Mixed-Signal Telecommunications Chip. - Paul Astrachan; Todd Brooks; Jody Everett; Wai-On Law; Kenneth McIntyre; Chuong Nguyen; Charles Weng (ITC, 1992)

Path-Delay Fault Simulation for a Standard Scan Design Methodology. - Sungho Kang; Wai-On Law; Bill Underwood (ICCD, 1994)

Fastpath: A Path-Delay Test Generator for Standard Scan Designs. - Bill Underwood; Wai-On Law; Sungho Kang; Haluk Konuk (ITC, 1994)

A Technology-Independent Methodology of Placement Generation for Analog Circuit. - Wai-chee Wong; Philip C. H. Chan; Wai-On Law (ASP-DAC, 1999)