Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate. - Walid Amir; Dae-Hyun Kim; Tae-Woo Kim (IEEE Access, 2020)

Trap Behavior of Metamorphic HEMTs with Pulsed IV and $1/f$ Noise Measurement. - Ki-Yong Shin; Ju-Won Shin; Surajit Chakraborty; Walid Amir; Chan-Soo Shin; Tae-Woo Kim (ESSDERC, 2022)