Interband-Tunneling III-V Semiconductor Structures for Multiple-Valued Literal and Arithmetic Functions. - Lutz J. Micheel; Hans L. Hartnagel; Wallace T. Anderson; Stephen W. Kirchoefer; Nicolas A. Papanicolaou (ISMVL, 1994)

Editorial. - Wallace T. Anderson; Roberto Menozzi (Microelectron. Reliab., 2001)

Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. - Wallace T. Anderson; Jason A. Roussos; Jeffrey A. Mittereder; Dimitrios E. Ioannou; C. Moglestue (Microelectron. Reliab., 2001)

Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. - Jeffrey A. Mittereder; Jason A. Roussos; Wallace T. Anderson; Dimitrios E. Ioannou (IEEE Trans. Reliab., 2002)