Simulation of SET faults in a voltage controlled oscillator. - Walter E. Calienes Bartra; Fernanda Lima Kastensmidt; Ricardo Reis 001 (LATW, 2012)

A set of Virtual Instruments to simulate radiation effects in CMOS circuits. - Walter E. Calienes Bartra; Ricardo Reis 001 (I2MTC, 2014)

Bulk and FDSOI SRAM resiliency to radiation effects. - Walter E. Calienes Bartra; Ricardo Augusto da Luz Reis; Costin Anghel; Andrei Vladimirescu (MWSCAS, 2014)

Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients. - Walter E. Calienes Bartra; Andrei Vladimirescu; Ricardo Reis 001 (ICECS, 2015)

Modeling the impact of heavy ion on FDSOI NanoCMOS. - Walter E. Calienes Bartra; Ricardo Reis 001; Andrei Vladimirescu (LASCAS, 2015)

FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects. - Walter E. Calienes Bartra; Andrei Vladimirescu; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2016)

Process and temperature impact on single-event transients in 28nm FDSOI CMOS. - Walter E. Calienes Bartra; Andrei Vladimirescu; Ricardo Reis 001 (LASCAS, 2017)

Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. - Walter E. Calienes Bartra; Y. Q. de Aguiar; Cristina Meinhardt; Andrei Vladimirescu; Ricardo Augusto da Luz Reis (Microelectron. Reliab., 2017)

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. - Cleiton Magano Marques; Leonardo Heitich Brendler; Frédéric Wrobel; Alexandra L. Zimpeck; Walter E. Calienes Bartra; Paulo F. Butzen; Cristina Meinhardt (SBCCI, 2023)