Design based analog testing by Characteristic Observation Inference. - Walter M. Lindermeir; Helmut E. Graeb; Kurt Antreich (ICCAD, 1995)

Design of robust test criteria in analog testing. - Walter M. Lindermeir (ICCAD, 1996)

Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. - Walter M. Lindermeir; Thomas J. Vogels; Helmut E. Graeb (DATE, 1998)

Analog testing by characteristic observation inference. - Walter M. Lindermeir; Helmut E. Graeb; Kurt Antreich (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)