IDDQ Testing of CMOS Opens: An Experimental Study. - Adit D. Singh; Haroon Rasheed; Walter W. Weber (ITC, 1995)

An experimental evaluation of the differential BICS for IDDQ testing. - Walter W. Weber; Adit D. Singh (VTS, 1995)

Incorporating IDDQ Testing with BIST for Improved Coverage: An Experimental Study. - Walter W. Weber; Adit D. Singh (J. Electron. Test., 1997)