High-Speed and High-Sensitivity Metal-Semiconductor-Metal Photodetectors for Optoelectronic Integrated Circuit Applications - Walter Wohlmuth (1997)

Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. - Ming-Hung Weng; Chao-Hung Chen; Che-Kai Lin; Shih-Hui Huang; Jhih-Han Du; Sheng-Wen Peng; Walter Wohlmuth; Frank Yung-Shi Chou; Chang-Hwang Hua (Microelectron. Reliab., 2014)

Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection. - Jian-Hsing Lee; Yeh-Jen Huang; Li-Yang Hong; Li-Fan Chen; Yeh-Ning Jou; Shin-Cheng Lin; Walter Wohlmuth; Chih-Cherng Liao; Ching-Ho Li; Shoa-Chang Huang; Ke-Horng Chen (IRPS, 2022)