Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. - Yiwen Shi; Wan-Chan Hu; Jennifer Dworak (VTS, 2010)

Partial state monitoring for fault detection estimation. - Yiwen Shi; Kantapon Kaewtip; Wan-Chan Hu; Jennifer Dworak (ITC, 2011)