A novel fuzzy matching model for lithography hotspot detection. - Sheng-Yuan Lin; Jing-Yi Chen; Jin-Cheng Li; Wan-Yu Wen; Shih-Chieh Chang (DAC, 2013)

Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs. - Yu-Guang Chen; Tao Wang; Kuan-Yu Lai; Wan-Yu Wen; Yiyu Shi 001; Shih-Chieh Chang (DAC, 2014)

A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection. - Wan-Yu Wen; Jin-Cheng Li; Sheng-Yuan Lin; Jing-Yi Chen; Shih-Chieh Chang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Q-Learning Based Dynamic Voltage Scaling for Designs with Graceful Degradation. - Yu-Guang Chen; Wan-Yu Wen; Tao Wang; Yiyu Shi 001; Shih-Chieh Chang (ISPD, 2015)

Novel Spare TSV Deployment for 3-D ICs Considering Yield and Timing Constraints. - Yu-Guang Chen; Wan-Yu Wen; Yiyu Shi 001; Wing-Kai Hon; Shih-Chieh Chang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

A novel low-cost dynamic logic reconfigurable structure strategy for low power optimization. - Yu-Guang Chen; Wan-Yu Wen; Yun-Ting Wang; You-Luen Lee; Shih-Chieh Chang (ASP-DAC, 2016)