An Intelligent Software-Integrated Environment of IC Testing. - Yuning Sun; Xiaoming Wang; Wanchun Shi (ITC, 1994)

ICTSSE: An object-oriented IC test software supporting environment. - Yuning Sun; Xiaoming Wang; Wanchun Shi (J. Comput. Sci. Technol., 1995)

A Novel Approach to the Analysis of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (ITC, 1996)

OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (ITC, 1997)

Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (J. Electron. Test., 1999)