An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation. - Wangyang Zhang; Wenjian Yu; Zeyi Wang; Zhiping Yu; Rong Jiang; Jinjun Xiong (DATE, 2008)

Variational capacitance extraction of on-chip interconnects based on continuous surface model. - Wenjian Yu; Chao Hu; Wangyang Zhang (DAC, 2009)

Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression. - Wangyang Zhang; Tsung-Hao Chen; Ming Yuan Ting; Xin Li 001 (DAC, 2010)

Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference. - Wangyang Zhang; Xin Li 001; Rob A. Rutenbar (DAC, 2010)

Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation. - Wangyang Zhang; Xin Li 001; Emrah Acar; Frank Liu 001; Rob A. Rutenbar (ICCAD, 2010)

Parallel statistical capacitance extraction of on-chip interconnects with an improved geometric variation model. - Wenjian Yu; Chao Hu; Wangyang Zhang (ASP-DAC, 2011)

Toward efficient spatial variation decomposition via sparse regression. - Wangyang Zhang; Karthik Balakrishnan; Xin Li 001; Duane S. Boning; Rob A. Rutenbar (ICCAD, 2011)

Test cost reduction through performance prediction using virtual probe. - Hsiu-Ming Chang 001; Kwang-Ting Cheng; Wangyang Zhang; Xin Li 001; Kenneth M. Butler (ITC, 2011)

Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. - Wangyang Zhang; Xin Li 001; Frank Liu 001; Emrah Acar; Rob A. Rutenbar; Ronald D. Blanton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Large-scale statistical performance modeling of analog and mixed-signal circuits. - Xin Li 001; Wangyang Zhang; Fa Wang (CICC, 2012)

Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion. - Xin Li 001; Wangyang Zhang; Fa Wang; Shupeng Sun; Chenjie Gu (ICCAD, 2012)

A dynamic method for efficient random mismatch characterization of standard cells. - Wangyang Zhang; Amith Singhee; Jinjun Xiong; Peter A. Habitz; Amol Joshi; Chandu Visweswariah; James Sundquist (ICCAD, 2012)

Spatial variation decomposition via sparse regression. - Wangyang Zhang; Karthik Balakrishnan; Xin Li 001; Duane S. Boning; Emrah Acar; Frank Liu 001; Rob A. Rutenbar (ICICDT, 2012)

IC Spatial Variation Modeling: Algorithms and Applications. - Wangyang Zhang (2012)

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. - Fa Wang; Wangyang Zhang; Shupeng Sun; Xin Li 001; Chenjie Gu (DAC, 2013)

Automatic clustering of wafer spatial signatures. - Wangyang Zhang; Xin Li 001; Sharad Saxena; Andrzej J. Strojwas; Rob A. Rutenbar (DAC, 2013)

Test data analytics - Exploring spatial and test-item correlations in production test data. - Chun-Kai Hsu; Fan Lin; Kwang-Ting Cheng; Wangyang Zhang; Xin Li 001; John M. Carulli; Kenneth M. Butler (ITC, 2013)

Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression. - Wangyang Zhang; Karthik Balakrishnan; Xin Li 001; Duane S. Boning; Sharad Saxena; Andrzej J. Strojwas; Rob A. Rutenbar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data. - Fa Wang; Paolo Cachecho; Wangyang Zhang; Shupeng Sun; Xin Li 001; Rouwaida Kanj; Chenjie Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Attention Routing: track-assignment detailed routing using attention-based reinforcement learning. - Haiguang Liao; Qingyi Dong; Xuliang Dong; Wentai Zhang 002; Wangyang Zhang; Weiyi Qi; Elias Fallon; Levent Burak Kara (CoRR, 2020)