A Novel Eddy Current Method for Defect Detection Immune to Lift-Off. - Pu Huang; Hang Pu; Jiyao Li; Yiqing Ding; Wanpeng Zhang 004; Lijun Xu 001; Yuedong Xie (IEEE Trans. Instrum. Meas., 2022)

Distribution Retrieval of Both Depth and Reflectivity in 3-D Objects via Using Modulated Single Pixel Imaging. - Wanpeng Zhang 004; Zhang Cao; Hongyu Zhang; Heng Xie; Zhen Ye; Lijun Xu 001 (IEEE Trans. Instrum. Meas., 2023)