A single event upset tolerant latch design. - Haibin Wang; Xixi Dai; Yangsheng Wang; Issam Nofal; Li Cai; Zicai Shen; Wanxiu Sun; Jinshun Bi; Bo Li 051; Gang Guo; Li Chen 001; Sang H. Baeg (Microelectron. Reliab., 2018)