High-resolution in-situ of gold electromigration: test time reduction. - Kris Croes; R. Dreesen; Jean Manca; Ward De Ceuninck; Luc De Schepper; Luc Tielemans; P. J. van der Wel (Microelectron. Reliab., 2001)

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. - R. Dreesen; Kris Croes; Jean Manca; Ward De Ceuninck; Luc De Schepper; A. Pergoot; Guido Groeseneken (Microelectron. Reliab., 2001)

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. - R. Petersen; Ward De Ceuninck; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2001)

Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. - R. Petersen; Ward De Ceuninck; Jan D'Haen; Marc D'Olieslaeger; Luc De Schepper; Olivier Vendier; Hervé Blanck; Dominique Pons (Microelectron. Reliab., 2002)

How reliable are reliability tests? - Luc Tielemans; R. Rongen; Ward De Ceuninck (Microelectron. Reliab., 2002)

A new method for the analysis of high-resolution SILC data. - Stefano Aresu; Ward De Ceuninck; G. Knuyt; J. Mertens; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2003)

Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. - Philippe Soussan; G. Lekens; R. Dreesen; Ward De Ceuninck; Eric Beyne (Microelectron. Reliab., 2003)

Evidence for source side injection hot carrier effects on lateral DMOS transistors. - Stefano Aresu; Ward De Ceuninck; Geert Van den Bosch; Guido Groeseneken; Peter Moens; Jean Manca; D. Wojciechowski; P. Gassot (Microelectron. Reliab., 2004)

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. - Leen Biesemans; K. Schepers; Kris Vanstreels; Jan D'Haen; Ward De Ceuninck; Marc D'Olieslaeger (Microelectron. Reliab., 2004)

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. - Kris Vanstreels; Marc D'Olieslaeger; Ward De Ceuninck; Jan D'Haen; Karen Maex (Microelectron. Reliab., 2005)

Lifetime modeling of intrinsic gate oxide breakdown at high temperature. - R. Moonen; Piet Vanmeerbeek; G. Lekens; Ward De Ceuninck; Peter Moens; J. Boutsen (Microelectron. Reliab., 2007)

Embedded Unit for Point-of-Care Impedance Based Biosensor Readout. - Jeroen Broeders; Dieter Croux; Ans Weustenraed; Thomas Cleij; Patrick H. Wagner; Ward De Ceuninck; Wouter Vanaken; Stijn Duchateau; Ronald Thoelen (HPCC-ICESS, 2012)

Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection Limits. - Bram Geerets; Marloes Peeters; Bart van Grinsven; Karolien Bers; Ward De Ceuninck; Patrick H. Wagner (Sensors, 2013)

Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface Interactions. - Thijs Vandenryt; Andrea Pohl; Bart van Grinsven; Ronald Thoelen; Ward De Ceuninck; Patrick H. Wagner; Jörg Opitz (Sensors, 2013)

Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted Polymers. - Gideon Wackers; Thijs Vandenryt; Peter Cornelis; Evelien Kellens; Ronald Thoelen; Ward De Ceuninck; Patricia Losada-Pérez; Bart van Grinsven; Marloes Peeters; Patrick H. Wagner (Sensors, 2014)

Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic Receptors. - Thijs Vandenryt; Bart van Grinsven; Kasper Eersels; Peter Cornelis; Safira Kholwadia; Thomas Cleij; Ronald Thoelen; Ward De Ceuninck; Marloes Peeters; Patrick H. Wagner (Sensors, 2017)

Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules. - Philippe Nivelle; Tom Borgers; Eszter Voroshazi; Jef Poortmans; Jan D'Haen; Ward De Ceuninck; Michael Daenen (IRPS, 2018)