Breakdown behaviour of high-voltage GaN-HEMTs. - Wataru Saito; Takeshi Suwa; Takeshi Uchihara; Toshiyuki Naka; Taichi Kobayashi (Microelectron. Reliab., 2015)

Destruction failure analysis and international reliability test standard for power devices. - Takashi Setoya; Tsuneo Ogura; Wataru Saito; Tomoko Matsudai; Koichi Endo (Microelectron. Reliab., 2015)

Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity scanning spreading resistance microscopy (SSRM) for power device applications. - Li Zhang 033; Mitsuo Koike; Mizuki Ono; Shogo Itai; Kazuya Matsuzawa; Syotaro Ono; Wataru Saito; Masakazu Yamaguchi; Yohei Hayase; Keiryo Hara (Microelectron. Reliab., 2015)

UIS test of high-voltage GaN-HEMTs with p-type gate structure. - Wataru Saito; Toshiyuki Naka (Microelectron. Reliab., 2016)

3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat). - Kazuo Tsutsui; Kuniyuki Kakushima; Takuya Hoshii; A. Nakajima; Shinichi Nishizawa; Hitoshi Wakabayashi; Iriya Muneta; K. Sato; Tomoko Matsudai; Wataru Saito; Takuya Saraya; K. Itou; et al. (ASICON, 2017)

Modeling of Field-Plate Effect on Gallium-Nitride-Based High Electron Mobility Transistors for High-Power Applications. - Takeshi Mizoguchi; Toshiyuki Naka; Yuta Tanimoto; Yasuhiro Okada; Wataru Saito; Mitiko Miura-Mattausch; Hans Jürgen Mattausch (IEICE Trans. Electron., 2017)

Relation between UIS withstanding capability and I-V characteristics in high-voltage GaN-HEMTs. - Wataru Saito; Toshiyuki Naka (Microelectron. Reliab., 2017)

Switching of 3300V Scaled IGBT by 5V Gate Drive. - Toshiro Hiramoto; Katsumi Satoh; Tomoko Matsudai; Wataru Saito; Kuniyuki Kakushima; Takuya Hoshii; Kazuyoshi Furukawa; Masahiro Watanabe; Naoyuki Shigyo; Hitoshi Wakabayashi; Kazuo Tsutsui; Hiroshi Iwai; et al. (ASICON, 2019)

An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor. - Fukashi Morishita; Masanori Otsuka; Wataru Saito (ATS, 2020)

A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator. - Wataru Saito; Yoichi Iizuka; Norihito Kato; Ryota Otake; Fukashi Morishita (A-SSCC, 2021)

Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses. - Joseph P. Kozak; Qihao Song; Jingcun Liu; Ruizhe Zhang 003; Qiang Li; Wataru Saito; Yuhao Zhang (IRPS, 2022)

GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery. - Qihao Song; Joseph P. Kozak; Yunwei Ma; Jingcun Liu; Ruizhe Zhang 003; Roman Volkov; Daniel Sherman; Kurt V. Smith; Wataru Saito; Yuhao Zhang (IRPS, 2022)

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor. - Fukashi Morishita; Wataru Saito; Norihito Kato; Yoichi Iizuka; Masao Ito (IEICE Trans. Electron., 2022)

A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera. - Fukashi Morishita; Wataru Saito; Yoichi Iizuka; Norihito Kato; Ryota Otake; Masao Ito (IEEE J. Solid State Circuits, 2022)

A Low Noise 8Mpixel CMOS Image Sensor with 5.36GHz Global Counter and Dual Latch Skew Canceler for Surveillance AI Camera System. - Yoichi Iizuka; Akihide Maezono; Wataru Saito; Atsushi Yamane; Kazuhiko Takami; Fukashi Morishita (A-SSCC, 2023)

IGBT Power Module Design for Suppressing Gate Voltage Spike at Digital Gate Control. - Zaiqi Lou; Thatree Mamee; Katsuhiro Hata; Makoto Takamiya; Shinichi Nishizawa; Wataru Saito (IEEE Access, 2023)

A Compact Optical Image Stabilization Chip with Actuator Trackability Improvement Controller and Double Offset Cancel Hall Amplifier to Improve Camera Shake Correction. - Wataru Saito; Yoichi Iizuka; Tetsuya Takahashi; Toshiya Suzuki; Hiroto Suzuki; Masatomo Shoji; Fukashi Morishita (A-SSCC, 2024)

Estimating of IGBT Bond Wire Lift-Off Trend Using Convolutional Neural Network (CNN). - Thatree Mamee; Zaiqi Lou; Katsuhiro Hata; Makoto Takamiya; Takayasu Sakurai; Shinichi Nishizawa; Wataru Saito (IEEE Access, 2024)

Design of a Battery Charger Boost Converter for Extremely Low Supply Voltages Below 10 mV in Energy Harvesting: A Return-on-Investment Approach. - Wataru Saito; Toru Tanzawa (NewCAS, 2025)

A Low Noise 8.3-Mpixel CMOS Image Sensor With Selectable Multiple Sampling Technique by 5.36 GHz Global Counter and Dual Latch Skew Canceler. - Yoichi Iizuka; Akihide Maezono; Wataru Saito; Kazuhiko Takami; Fukashi Morishita (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)