More effective computer packages for applications. - Wayne B. Nelson; Mary Phillips; Linda Thumhart (AFIPS National Computer Conference, 1973)

Theory and Applications of Hazard Plotting for Censored Failure Data. - Wayne B. Nelson (Technometrics, 2000)

A bibliography of accelerated test plans. - Wayne B. Nelson (IEEE Trans. Reliab., 2005)

A bibliography of accelerated test plans part II - references. - Wayne B. Nelson (IEEE Trans. Reliab., 2005)

Residuals and Their Analyses for Accelerated Life Tests With Step and Varying Stress. - Wayne B. Nelson (IEEE Trans. Reliab., 2008)

Statistical Methods for Reliability Data, Second Edition, . - Wayne B. Nelson (Technometrics, 2021)

Advances in Accelerated Life Tests With Step and Varying Stress. - Wayne B. Nelson (IEEE Trans. Reliab., 2024)