DFT Strategy for Intel Microprocessors. - Wayne M. Needham; Naga Gollakota (ITC, 1996)

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken; Wojciech Maly (ITC, 1997)

Microprocessor Test and Validation: Any New Avenues? - Magdy S. Abadir; Jacob A. Abraham; Hong Hao; C. Hunter; Wayne M. Needham; Ron G. Walther (VTS, 1997)

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken (VTS, 1997)

Just how real is the SIA roadmap. - Wayne M. Needham (ITC, 1998)

High volume microprocessor test escapes, an analysis of defects our tests are missing. - Wayne M. Needham; Cheryl Prunty; Yeoh Eng Hong (ITC, 1998)

Best Methods for At-Speed Testing? - Peter C. Maxwell; Steve Baird; Wayne M. Needham; Al Crouch; Phil Nigh (VTS, 1998)

Guest Editor's Introduction: Microprocessor Testing Today. - Wayne M. Needham (IEEE Des. Test Comput., 1998)

Nanometer Technology Challenges for Test and Test Equipment. - Wayne M. Needham (Computer, 1999)