A Complete Logic BIST Technology with No Storage Requirement. - Wei-Cheng Lien; Kuen-Jong Lee (Asian Test Symposium, 2010)

Test Response Compaction via Output Bit Selection. - Kuen-Jong Lee; Wei-Cheng Lien; Tong-Yu Hsieh (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh (Asian Test Symposium, 2012)

Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors. - Wei-Cheng Lien; Albert P. Pisano; Dung-Sheng Tsai; Jr-Hau He; Debbie G. Senesky (ESSDERC, 2012)

Accumulator-based output selection for test response compaction. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh; Shih-Shiun Chien; Krishnendu Chakrabarty (ISCAS, 2012)

Routing-efficient implementation of an internal-response-based BIST architecture. - Wei-Cheng Lien; Tong-Yu Hsieh; Kuen-Jong Lee (VLSI-DAT, 2012)

A New LFSR Reseeding Scheme via Internal Response Feedback. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh; Krishnendu Chakrabarty (Asian Test Symposium, 2013)

An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh; Wee-Lung Ang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Counter-Based Output Selection for Test Response Compaction. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh; Krishnendu Chakrabarty; Yu-Hua Wu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment. - Shiqian Shao; Wei-Cheng Lien; Ayden Maralani; Albert P. Pisano (ESSDERC, 2014)

Output-bit selection with X-avoidance using multiple counters for test-response compaction. - Wei-Cheng Lien; Kuen-Jong Lee; Krishnendu Chakrabarty; Tong-Yu Hsieh (ETS, 2014)

Output selection for test response compaction based on multiple counters. - Wei-Cheng Lien; Kuen-Jong Lee; Krishnendu Chakrabarty; Tong-Yu Hsieh (VLSI-DAT, 2014)

An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model. - Cheng-Hung Wu; Kuen-Jong Lee; Wei-Cheng Lien (VTS, 2014)

Efficient LFSR Reseeding Based on Internal-Response Feedback. - Wei-Cheng Lien; Kuen-Jong Lee; Tong-Yu Hsieh; Krishnendu Chakrabarty (J. Electron. Test., 2014)

Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing. - Yi-Hua Li; Wei-Cheng Lien; Ing-Chao Lin; Kuen-Jong Lee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Output bit selection methodology for test response compaction. - Wei-Cheng Lien; Kuen-Jong Lee (ITC, 2016)

Unveiling of How Image Restoration Contributes to Underwater Object Detection. - Wen-Yi Peng; Yan-Tsung Peng; Wei-Cheng Lien; Chu-Song Chen (ICCE-TW, 2021)

Traffic Violation Detection via Depth and Gradient Angle Change. - Yan-Tsung Peng; Chen-Yu Liu; He-Hao Liao; Wei-Cheng Lien; Gee-Sern Jison Hsu (ICITE, 2022)

A rapid household mite detection and classification technology based on artificial intelligence-enhanced scanned images. - Lydia Hsiao-Mei Lin; Wei-Cheng Lien; Cindy Yu-Ting Cheng; You-Cheng Lee; Yi-Ting Lin; Chin-Chia Kuo; Yi-Ting Lai; Yan-Tsung Peng (Internet Things, 2025)