Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique. - Bo-Hua Chen; Wei-Chung Kao; Bing-Chuan Bai; Shyue-Tsong Shen; James C.-M. Li (ATS, 2007)

DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. - Wei-Chung Kao; Wei-Shun Chuang; Shiu-Ting Lin; Chien-Mo James Li; Vasco Manquinho (IEEE Trans. Very Large Scale Integr. Syst., 2010)