Feature Selection and Cross Validation for Physical-Layer RFID Counterfeit Tag Identification. - Haifeng Wu; Wei Gao 061; Chongrong Pu; Yu Zeng 002 (IEEE Trans. Instrum. Meas., 2022)

Cognitive Risk Control for Physical-Layer RFID Counterfeit Tag Identification. - Haifeng Wu; Chongrong Pu; Wei Gao 061; Yu Zeng 002 (IEEE Trans. Instrum. Meas., 2023)