Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits. - Shiue-Tsung Shen; Wei-Hsiao Liu; En-Hua Ma; James Chien-Mo Li; I-Chun Cheng (Asian Test Symposium, 2009)

Very-Low-Voltage testing of amorphous silicon TFT circuits. - Shiue-Tsung Shen; Wei-Hsiao Liu; Chien-Mo James Li; I-Chun Cheng (ITC, 2009)